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Veeco Introduces New Thermal Analysis Capability for SPM

November, 10, 2008

Advances Nanoscale Material Identification


Plainview, NY, November 10, 2008 -- Veeco Instruments Inc. (Nasdaq: VECO), a leading provider of instrumentation to the nanoscience community, today introduced the Veeco Instruments Thermal Analysis (VITA™) module for its industry leading line of Scanning Probe Microscopes (SPMs). VITA technology advances nanoscale material identification by providing characterization capabilities through nanoscale thermal analysis (nTA), scanning thermal microscopy (SThM), and heated-tip AFM. Together these techniques enable the precise determination of local transition temperatures as well as mapping of temperature and thermal conductivity variations. The VITA accessory is compatible with Veeco’s Innova™, Caliber™, MultiMode®, and Dimension™ systems.


According to David Rossi, Vice President, General Manager, Veeco’s Nano-Bio AFM Business, “By marrying the power of traditional bulk thermal analysis with the resolution of atomic force microscopy (AFM), VITA technology opens the door to quantitative thermal nanoscale characterization, and ultimately nanoscale material identification.” VITA is applicable for quantitative material characterization of a wide range of materials, from complex polymer blends to coatings to pharmaceuticals.


Dr. Stefan Kaemmer, Manager of Veeco’s Knowledge and Applications Group, commented, “VITA technology was developed as part of Veeco’s commitment to innovation and building SPMs into  comprehensive nanoscale characterization tools, and is a continuation of our longstanding expertise in thermal property mapping. We are able to fully exploit the industry’s latest tip developments to take a giant step forward in spatial resolution. Researchers with a need for high-resolution thermal property measurements can now benefit from a full suite of techniques while leveraging the industry-leading performance of our AFMs.”


More about VITA

Like Veeco’s highly successful release of HarmoniX™ Nanoscale Material Property Mapping mode, VITA delivers quantitative data with nanoscale resolution. Together these two advances represent Veeco’s leadership in moving beyond merely generating spatial maps of AFM signal variations to actual quantitative measurements of material properties, and ultimately material identification at the nanoscale. Further information may be found at .



About Veeco

Veeco Instruments Inc. designs, manufactures, markets and services enabling solutions for customers in the HB-LED, solar, data storage, semiconductor, scientific research and industrial markets. We have leading technology positions in our three businesses: LED & Solar Process Equipment, Data Storage Process Equipment, and Metrology Instruments. Veeco's product development, marketing, engineering and manufacturing facilities are located in New York, New Jersey, California, Colorado, Arizona, Massachusetts and Minnesota. Global sales and service offices are located throughout the U.S., Europe, Japan and Asia Pacific.


To the extent that this news release discusses expectations or otherwise makes statements about the future, such statements are forward-looking and are subject to a number of risks and uncertainties that could cause actual results to differ materially from the statements made. These factors include the risks discussed in the Business Description and Management's Discussion and Analysis sections of Veeco's Annual Report on Form 10-K for the year ended December 31, 2009 and in our subsequent quarterly reports on Form 10-Q, current reports on Form 8-K and press releases.Veeco does not undertake any obligation to update any forward-looking statements to reflect future events or circumstances after the date of such statements.

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