PLAINVIEW, N.Y.--(BUSINESS WIRE)--July 1, 2008--Veeco Instruments
Inc. (Nasdaq: VECO), a leading provider of instrumentation to the
nanoscience community, today introduced the Veeco Labs Research Grant
Program, designed to stimulate the generation of new scientific
investigation for researchers in the atomic force microscopy
community. This grant program will sponsor selected early adopters of
current and future Veeco technologies in a variety of ways to enable
the realization of their proposed work.
The first of the Veeco Labs grants will solicit proposals
utilizing the recently-released HarmoniX(TM) Nanoscale Material
Property Mapping Mode, which enables AFM users to simultaneously, and
in real time, acquire high-resolution images as well as
high-resolution, quantitative material property maps. These proposals,
due by October 1, 2008, will be judged on creativity, scientific merit
and applicability to real-world applications challenges. The five best
submissions will be awarded a Veeco HarmoniX Kit, to be used with any
Veeco system operating on the latest NanoScope(R) V Controller. This
combination will enable the full-treatment HarmoniX Mode to be used to
further investigate the proposed science and for other materials
research.
David Rossi, Vice President, General Manager of Veeco's Nano-Bio
AFM Business, stated Our desire is to stimulate groundbreaking
studies enabled by Veeco's AFM technology advances in various
materials fields. Through this grant program, we will continue to help
our customers advance the science that is done with SPMs, and make it
even easier to deliver new technology to the front lines of emerging
applications.
Dr. Bede Pittenger, Sr. Development Scientist and leader of the
HarmoniX effort inside of Veeco, commented, Our first experiences
with customer use of this system showed a great deal of promise for
enabling new research and has generated excitement throughout the AFM
user community, as all of the data is the first of its kind, with new
information never before accessible in this way. I think it will be
very interesting and gratifying to see the results and impact of the
first five grant winners.
The winners of this competition will also received an expense-paid
trip to the Seeing at the NanoScale VII AFM Conference in Santa
Barbara, CA, in the summer of 2009.
About HarmoniX
Veeco's NanoScope V Microscope Controller and proprietary probes
provide the speed, signal levels, and processing power necessary to
render high-resolution data never before seen in real time. HarmoniX
acquires real-time force curves by measuring the cantilever's
torsional and flexural motion each time the AFM tip interacts with the
surface in TappingMode(TM). Proprietary algorithms instantly calculate
the force curves that occur when the tip taps the surface, and analyze
them to obtain multiple sample characteristics. These material
properties are then rendered in image maps that correlate to the
sample topography image. These maps are quantitative and directly
traceable to the Elastic Modulus of the sample being imaged. To learn
more about HarmoniX, and to see a video of how it works, visit
http://www.veeco.com/library/HarmoniX_Materials_Mapping/index.aspx.
About Veeco
Veeco Instruments Inc. manufactures enabling solutions for
customers in the HB-LED, solar, data storage, semiconductor,
scientific research and industrial markets. We have leading technology
positions in our three businesses: LED & Solar Process Equipment, Data
Storage Process Equipment, and Metrology Instruments. Veeco's
manufacturing and engineering facilities are located in New York, New
Jersey, California, Colorado, Arizona, Minnesota and Massachusetts.
Global sales and service offices are located throughout the U.S.,
Europe, Japan and APAC. http://www.veeco.com/
To the extent that this news release discusses expectations or
otherwise makes statements about the future, such statements are
forward-looking and are subject to a number of risks and uncertainties
that could cause actual results to differ materially from the
statements made. These factors include the risks discussed in the
Business Description and Management's Discussion and Analysis sections
of Veeco's Annual Report on Form 10-K for the year ended December 31,
2007 and in our subsequent quarterly reports on Form 10-Q, current
reports on Form 8-K and press releases. Veeco does not undertake any
obligation to update any forward-looking statements to reflect future
events or circumstances after the date of such statements.
CONTACT: Metrology Marketing Communications
Karen Gertz, 805-967-2700 x2412
SOURCE: Veeco Instruments Inc.